We have studied the surface electronic structure of AV(10)O(15) (A= Ba, Sr) and Ba0.9Sr0.1V13O18 by using x-ray photoemission spectroscopy (XPS). The V 2 (p) under bar XPS shows multiple peaks associated with the charge fluctuation in the system. The relative intensity of each valence component can be extracted by Gaussian and Voigt fittings. The result strongly depends on the number of Gaussians/Voigts. In BaV10O15 and Ba0.9Sr0.1V13O18, the surface state has more V3+ than the bulk. In addition to the presence of surface V3+, the V2.5+ in AV(10)O(15) (A = Ba, Sr) and V2+ in Ba0.9Sr0.1V13O18 systems are observed even in the surface sensitive XPS. The number of Gaussians/Voigts should be as large as four for the V 2 (p) under bar (3/2), in order to obtain the results consistent with the bulk sensitive HAXPES study.

V 2p core-level spectroscopy of V2+/V3+mixed valence AV10O15(A = Ba, Sr) and Ba0.9Sr0.1V13O18 / Dash, S.; Kajita, T.; Yoshino, T.; Saini, N. L.; Katsufuji, T.; Mizokawa, T.. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - 223:(2018), pp. 11-20. [10.1016/j.elspec.2017.12.002]

V 2p core-level spectroscopy of V2+/V3+mixed valence AV10O15(A = Ba, Sr) and Ba0.9Sr0.1V13O18

Saini, N. L.;
2018

Abstract

We have studied the surface electronic structure of AV(10)O(15) (A= Ba, Sr) and Ba0.9Sr0.1V13O18 by using x-ray photoemission spectroscopy (XPS). The V 2 (p) under bar XPS shows multiple peaks associated with the charge fluctuation in the system. The relative intensity of each valence component can be extracted by Gaussian and Voigt fittings. The result strongly depends on the number of Gaussians/Voigts. In BaV10O15 and Ba0.9Sr0.1V13O18, the surface state has more V3+ than the bulk. In addition to the presence of surface V3+, the V2.5+ in AV(10)O(15) (A = Ba, Sr) and V2+ in Ba0.9Sr0.1V13O18 systems are observed even in the surface sensitive XPS. The number of Gaussians/Voigts should be as large as four for the V 2 (p) under bar (3/2), in order to obtain the results consistent with the bulk sensitive HAXPES study.
2018
Charge fluctuation; Peak fittings; Surface electronic properties; V2+/3+Charge ordering/fluctuation; V2.5+/3+Bond ordering; XPS; Electronic, Optical and Magnetic Materials; Radiation; Atomic and Molecular Physics, and Optics; Condensed Matter Physics; Spectroscopy; Physical and Theoretical Chemistry
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V 2p core-level spectroscopy of V2+/V3+mixed valence AV10O15(A = Ba, Sr) and Ba0.9Sr0.1V13O18 / Dash, S.; Kajita, T.; Yoshino, T.; Saini, N. L.; Katsufuji, T.; Mizokawa, T.. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - 223:(2018), pp. 11-20. [10.1016/j.elspec.2017.12.002]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1107464
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